The emergence of new dielectric liquids, including such exotic materials as nanofluids, emphasizes the need for accurate TC measurements which can be performed on a wide variety of complex test systems.
Various approaches to TC measurement di¬ffer in sensor construction and sample geometry requirements, and thus time and complexity involved in running a TC measurement varies. The modi¬fied transient plain source (MTPS) technique used by TCi sensor of C-Therm has many advantages. TCi can be employed to obtain high accuracy TC data, and to help identify more efficient transformer liquid with improved TC properties. The technology of TCi allows for TC measurements of solids, liquids, powders and pastes without special sample preparations. The method does not require samples to conform to the geometry of a test cell, and is a reliable and fast way of measuring TC particularly on relatively small amounts of liquid samples.
C-Therm TCi Thermal Conductivity Analyzer with Modified Transient Plane Source